Smartlab SE

Advanced Powder Diffraction Capabilities
The SmartLab SE supports a broad range of analytical workflows, including:
•    Phase identification and quantitative analysis of crystalline materials
•    Thin film diffraction studies and layered structures
•    Small-angle X-ray scattering (SAXS) for nanoscale characterization
•    Residual stress and texture analysis using pole figure measurements
•    Non-ambient experiments with configurable sample environments
With high angular precision and advanced control over X-ray optics, the system provides reliable data for both routine QA/QC and detailed structural research.

Detector availability
SmartLab SE offers flexible detector options to suit a variety of applications:
•    HyPix-400 2D hybrid pixel array detector (HPAD): High dynamic range and angular resolution, allowing seamless switching between 0D, 1D, and 2D measurement modes. Ideal for both powders and thin films.
•    D/teX Ultra 250 silicon strip detector: Fast 1D measurements with adjustable energy resolution for high-throughput diffraction experiments.
These detectors, combined with cross-beam optics and energy discrimination, deliver high signal-to-noise ratios and low background, enabling accurate measurements of complex or high-absorption samples.

Instrument Architecture and Design
The SmartLab SE features a vertically oriented θ-θ goniometer with factory-aligned optics for maximum mechanical stability. Its modular design allows users to switch between Bragg-Brentano and parallel beam configurations without changing optical components.
Key design features include:
•    Fully enclosed, radiation-safe cabinet
•    Self-aligning optics for automated setup and reduced downtime
•    Various modular cross-beam optics for flexible measurement geometries
•    External PC operation with intuitive SmartLab Studio II software
•    High-stability 3 kW X-ray source for demanding applications
This architecture minimizes maintenance, reduces total cost of ownership, and ensures the system is ready for accurate measurements at all times.

Technique Multipurpose X-ray diffraction
X-ray Source 3 kW sealed tube
Detector Options HyPix-400 2D HPAD, D/teX Ultra 250 silicon strip detector
Goniometer Type Vertical θ-θ, factory-aligned
Measurement Modes Powder diffraction, thin film diffraction, SAXS, pole figures, residual stress, non-ambient
Optics Various Cross-beam module options, Bragg-Brentano and parallel beam
Sample Types Powders, thin films, bulk solids, specialized non-ambient setups
Software SmartLab Studio II with built-in Guidance expert system
Cabinet Fully enclosed, interlocked radiation-safe cabinet
Power Requirements 3Ø 200 VAC 50/60 Hz 30 A or 1Ø 220–230 VAC 50/60 Hz 40 A
Dimensions (W×H×D) Approx. 1270 × 1880 × 1220 mm
Mass Approx. 800 kg

Note: Specifications may vary depending on system configuration and optional accessories. Optional features include sample environment chambers, automated sample changers, and temperature-controlled stages.