LS 13320 XR
The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology, which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.
- Direct measurement range from 10 nm – 3,500 µm
- Automatically highlights pass/fail results for faster quality control
- Enhanced software that simplifies method creation for standardized measurements
- New control standards to adequately verify instrument/module performance
Related products
-
Alexander Fogh
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 81 88 49 08
- Email: asf@ramcon.dk
-
Amalie Kofoed Jørgensen
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 50 60 05 15
- Email: akj@ramcon.dk
-
Mohammad Nehmé
Product Specialist
- Work area: Sales & Application
- Special area: Analysis & Lab Equipment, Material Characterization
- Phone +46 76 492 31 06
- Email: mne@ramcon.se
-
Muhamed Mahmutovic
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +46 70 726 57 10
- Email: mma@ramcon.se
-
Louise August Nielsen
Product Specialist
- Work area: Sales & Application
- Special area: Cell Solutions, Material Characterization, Fermentation
- Phone +45 50 60 52 42
- Email: lan@ramcon.dk