Smartlab XE

Leverantör Rigaku

Tillgänglig

The Rigaku SmartLab is a high-resolution (9kW rotating anode), multipurpose X-ray diffractometer engineered for advanced material characterization. Combining intelligent guidance software, automated optical systems, and versatile detector technology, it provides precise, reproducible measurements for powders, thin films, liquids, nanomaterials, and textiles. Its modular design and automation make it ideal for both research laboratories and industrial applications, including operando (real-time, in-situ) experiments.

Application Areas
The SmartLab is suitable for a wide range of applications:
• Thin Film metrology and multilayer characterization
• Academic research and teaching laboratories
• Materials science, chemistry, and nanotechnology R&D
• Industrial research and product Development
• Quality control for metals, ceramics, polymers, pharmaceuticals, and thin films
• Operando and in-situ experimental studies
Its intelligent automation and flexible design make it accessible to both experienced users and laboratories new to XRD.

Advanced Powder Diffraction and Thin Film Capabilities
SmartLab offers a comprehensive range of analytical capabilities, including:
• Powder diffraction for structural analysis and phase identification
• Thin film metrology and multilayer characterization
• Small-angle X-ray scattering (SAXS) for nanoscale studies
• In-plane scattering and texture analysis
• Operando / in-situ measurements under controlled conditions
The system delivers high angular precision, sharp peak resolution, and consistent data quality, making it suitable for both routine quality control and advanced research.

Detector
SmartLab features state-of-the-art detectors designed for versatility and performance:
• HyPix-3000 2D hybrid pixel array detector (HPAD): Supports 0D, 1D, and 2D measurement modes with high energy resolution, enabling all applications with a single detector. Ideal for powders, thin films, and micro-area measurements.
• D/teX Ultra 250 silicon strip detector: High-speed 1D measurements with adjustable energy resolution for rapid powder analysis.
Combined with automated cross-beam optics (CBO) and energy-discriminating capabilities, these detectors provide low background, high signal-to-noise ratio, and high-quality diffraction data across diverse sample types.

Instrument Architecture and Design
SmartLab incorporates a high-resolution vertical θ/θ goniometer with optional in-plane 5-axis arm for advanced orientation measurements. Its Cross-Beam-Optics (CBO) system allows fully automated switching between reflection and transmission modes without manual realignment. Modular CBO options including micro-area (CBO-μ) and automated switchable optics (CBO-Auto)
Product Information
• Optional in-plane 5-axis goniometer arm
• High-flux PhotonMax X-ray source (9 kW rotating anode)
• HyPix-3000 high-resolution 2D HPAD detector
• Cross-Beam Optics (CBO) family with automated switchable optics (CBO-Auto)
• High-resolution micro-area CBO (CBO-μ) for small sample regions
• Operando measurement capability via SmartLab Studio II software
• Multi-year component warranty for low cost of ownership

Technique X-ray diffraction (XRD)
X-ray Source 3 kW sealed tube (standard), optional PhotonMax 9 kW rotating anode
Detector Options HyPix-3000 2D HPAD, D/teX Ultra 250 silicon strip detector
Goniometer Type Vertical θ/θ, optional in-plane 5-axis arm
Measurement Modes Powder diffraction, thin film, SAXS, in-plane scattering, operando
Optics Cross-Beam Optics (CBO) automated reflection and transmission, micro-area CBO (CBO-μ)
Sample Types Powders, thin films, liquids, textiles, nanomaterials
Software SmartLab Studio II with intelligent Guidance
Cabinet Fully enclosed, radiation-safe
Power Requirements 1Ø 200–230 V 50/60 Hz 40 A or 3Ø 200 V 50/60 Hz 30–60 A (depending on source)
Dimensions (W×H×D) 1300 × 1880 × 1300 mm
Mass ~750 kg (with sealed tube), ~850 kg (with rotating anode)

Note: Optional accessories include automated sample changers, temperature-controlled stages, and in-plane measurement arms. Specifications may vary by configuration.