ZSX Primus IV

The ZSX Primus IV features an innovative optics-above (tube-above) configuration that minimizes contamination risks and reduces maintenance by keeping the beam path protected from sample debris. This design improves system reliability and maximizes instrument uptime.

Equipped with a 30 μm end-window X-ray tube, the thinnest in the industry, the instrument delivers excellent sensitivity for light element analysis. Advanced software tools such as ZSX Guidance and EZ Analysis simplify calibration and routine operation, while optional mapping and multi-spot analysis allow detailed investigation of inhomogeneous materials and elemental distribution.

Technique Wavelength dispersive X-ray fluorescence (WDXRF)
Benefit Elemental analysis of solids, liquids, powders, alloys and thin films
Technology Tube-above sequential WDXRF
Attributes 3 or 4 kW sealed X-ray tube, 48-position autosampler, analyze Be to U, vacuum
Options He-flush, additional analyzing crystals, r-θ stage/mapping
Computer External PC, MS Windows OS, ZSX software
Dimensions 1310 (W) x 1470 (H) x 890 (D) mm
Mass Approx. 620 kg (core unit)
Power requirements 1Ø, 200 VAC 50/60 Hz, 8 kW