MiniFlex

Advanced Powder Diffraction Capabilities
The MiniFlex platform enables:
•    Crystalline phase identification (phase ID)
•    Quantitative phase analysis (QPA)
•    Determination of percent crystallinity
•    Crystallite size and microstrain evaluation
•    Lattice parameter refinement
•    Rietveld refinement
•    Structural analysis of complex materials
Its design ensures high angular accuracy and reproducibility, supporting reliable peak position and intensity measurements across a wide 2θ range. 

Detector 
The system can be configured with advanced detector technologies optimized for speed, sensitivity, and low background noise. High-efficiency photon-counting detection allows rapid data acquisition while maintaining excellent peak resolution and signal-to-noise ratio.
Energy discrimination reduces background contributions from fluorescence, improving data quality when analyzing complex or high-absorption samples. This capability is especially beneficial when working with transition metals or multi-component systems. Together with optimized X-ray optics, the MiniFlex delivers high-quality diffraction patterns suitable for both routine phase identification and advanced quantitative modeling.

X-ray Source Sealed tube, selectable anode materials (e.g., Cu, Co, Mo)
Maximum Power Up to 600 W (typical tabletop configuration)
Colling type Both Internal or external colling system are available
Goniometer Type Vertical θ-θ goniometer, factory-aligned for stability
Angular Range 5° – 120° 2θ (configurable depending on application)
Angular Accuracy ±0.01° 2θ
Detector High-sensitivity photon-counting detector; optional 1D/2D mode
Sample Types Powders, bulk solids, pressed pellets, thin films
Sample Holder Capacity Multi-position holders or automated sample changer (optional)
Low-background, air-tight sampleholders, temperature controlled sampleholders (optional).
Beam Optics Variable incident beam slit, primary optics for collimation and divergence control
Data Acquisition Automated scanning, configurable step size and dwell time
Software Comprehensive diffraction analysis, including peak search, phase ID, Rietveld refinement, and quantitative analysis
Safety Fully enclosed, radiation-safe cabinet; interlocked doors
Power Supply 100–240 V AC, single phase (depending on region)
Footprint Compact tabletop design, minimal laboratory space required

Note: Specifications may vary depending on system configuration and optional accessories.