ZSX Primus IVi
TUBE-BELOW SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER. X-ray analysis of liquids, alloys, and plated metals. The tube-below high-performance model enables uncompromised analysis of samples such as liquids, alloys, and plated metals. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV𝒾 WDXRF spectrometer features a 30 micron Be tube window, the thinnest standard tube window in the industry, for exceptional light element (low-Z) detection limits.
Improved throughput. Improved mechanics minimize the analysis dead time. For example, a 16-element sequential quantitative measurement time improved from 348 seconds to 287 seconds, representing an 18% increase in efficiency.
Point/mapping analysis. Equipped with a high-resolution camera that allows the user to zoom in on small features for proper identification and analysis. Enables accurate analysis by eliminating differences in sensitivity caused by measurement placement. Superior design uses the hot-spot of the tube to maximize intensity/sensitivity.
Product Information
ZSX Guidance software
Intuitive software programmable for everyday analysis using sample trays
Improved accuracy of liquid sample analysis
High-speed, high-precision measurements
Unique functionality - the tube-below optics enables convenient functionality, including new sample film corrections
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Alexander Fogh
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 81 88 49 08
- Email: asf@ramcon.dk
-
Amalie Kofoed Jørgensen
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 50 60 05 15
- Email: akj@ramcon.dk
-
Christian Hansson
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +46 70 231 40 71
- Email: ch@ramcon.se